Wednesday, November 2, 2005 |
7-9pm |
Reception & On-Site Registration at Hyatt |
Thursday, November 3,
2005 |
7:30-8:30am |
Continental
Breakfast |
8:30-9:30am |
Keynote
Address |
9:30-11:50am (including a 10-15 minutes coffee
break) |
Session A: Architectural/Functional
Verification Organizer: Eli Almog, IBM
A.1 A
Study of Architecture Description Languages from a Model-based
Perspective Prof. Wei Qin (Boston University)
A.2 An
Introduction to the Plasma Language Brian Kahne, Pete Wilson,
and
Aseem Gupta (Freescale)
A.3
Embedded Processor Design and SW Tool Generation Using
LISA Andreas Hoffmann (CoWare)
A.4
Verifying Configurable ISAs Described in Tensilica's Instruction
Extension (TIE) Language Dhanendra Jani (Tensilica)
A.5
Processor Architecture Description Language for Test
Generation Eli Almog (IBM) |
11:50am-1pm |
Lunch
Break |
1pm – 2:40pm |
Session B: Debug and Diagnosis
B.1
Diagnosing faulty functional units in processors by using
automatically generated test sets P. Bernardi, E. Sanchez, M.
Schillaci, G. Squillero, M. Sonza Reorda Dipartimento di Automatica
e
Informatica, Politecnico di Torino, Italy
B.2
Post-Verification Debugging of Hierarchical Designs Moayad
Fahim Ali, University of Toronto Sean Safarpour, University of
Toronto Andreas Veneris, University of Toronto Magdy S. Abadir,
Freescale Semiconductor Rolf Drechsler, University of Bremen,
Germany
B.3 An
Investigation of Excitation Balance and Additional Mandatory Conditions
for the Diagnosis of Fortuitously Detected Defects Jennifer
Lynn
Dworak, Brown University
B.4
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor
Cores P. Bernardi, M. Grosso, M. Rebaudengo, M. Sonza
Reorda Politecnico di Torino, Dipartimento di Automatica e
Informatica,
Torino, Italy |
Coffee Break |
3:50 pm – 4:30pm |
Session C: SAT applications
C.1
Language-driven Validation of Pipelined Processors using
Satisfiability Solvers Prabhat Mishra Heon-Mo Koo Zhuo
Huang University of Florida, Gainesville, FL
C.2
Bounded Invariant Checking of Partial Implementations using a
Structural SAT-Solver Marc Herbstritt and Bernd
Becker Albert-Ludwigs-University Freiburg, Germany
C.3 PaMira
– a Parallel SAT Solver with Knowledge Sharing Tobias Schubert
Matthew Lewis Bernd Becker Institute for Computer Science,
Albert-Ludwigs-University of Freiburg, Freiburg,
Germany |
4:30 – 5:45pm |
Session D: Microprocessor test, circuit marginality
and
speed binning
D.1 Is
IDDQ Test of Microprocessors Feasible? Bin Xue and D. M. H.
Walker, Texas A&M University
D.2
Improved methods for Circuit Marginality, Speed Path &
Manufacturing
Defect Detection Greg Czajkowski, Dave LaFollette, Paul R.
Zehr Intel Corporation
D.3 A
study on speed binning with structural tests Benjamin Lee, Jing
Zeng, Li-C. Wang, Magdy S. Abadir UC-Santa barbara and
Freescale |
6-10pm |
Dinner and
Social Event |
November 4, Friday |
7:30 – 8:30am |
Continental
Breakfast |
8:30 – 9:45am |
Session E: Validation
E.1
Automated Extraction of Structural Information from SystemCbased IP
for Validation David Berner, Institut de Recherche en
Informatique
et Systèmes Aléatoires, France Hiren D. Patel, Virginia Polytechnic
and
State University Deepak A. Mathaikutty, Virginia Polytechnic and
State
University Sandeep K. Shukla, Virginia Polytechnic and State
University
E.2
Pre-Silicon Validation of IPF Memory Ordering for Multi-Core
Processors Paul R Zehr and Soohong Kim, Intel
Corporation
E.3
Automatic Generation of High Performance Embedded Memory Models for
PowerPC Microprocessors Jayanta Bhadra, Freescale
Semiconductor Magdy S. Abadir, Freescale Semiconductor David
Burgess, Freescale Semiconductor and Ekaterina Trofimova, Freescale
Semiconductor |
9:45am – 10am |
Coffee
Break |
10am – 11:40am |
Session F: High-level ATPG and
Verification
F.1 On PSL
Properties Re-use in SoC Design Flow Based on Transaction Level
Modeling Nicola Bombieri, STMicroelectronics Andrea Fedeli,
STMicroelectronics Franco Fummi, University of Verona
F.2 A
Pseudo-Deterministic Functional ATPG based on EFSM
Traversing G.
Di Guglielmo F. Fummi C. Marconcini G. Pravadelli Dipartimento di
Informatica - Università di Verona, Italy
F.3
SEARCH-SPACE OPTIMIZATIONS FOR HIGH-LEVEL ATPG Jorge Campos
and Hussain Al-Asaad University of California—Davis
F.4 HW/SW
Co-Verification of a RISC CPU using Bounded Model
Checking Daniel
Grosse, Ulrich Kuehne, Rolf Drechsler, University of
Bremen |
11:40 – 12:40pm |
Lunch
Break |
12:55 –
3pm |
Session E: Invited Presentations
E.1 3D
Packaging – Its impact and implications T. M. Mak, Intel
Corporation
E.2
Equivalence Checking -- An Industry Perspective Kei-Yong
Khoo,
Cadence Design Systems, Inc. (Verplex group)
E.3 A TDM
Test Scheduling Method for Network-on-Chip Systems Mark Nolen,
Rabi Mahapatra and Ray Mercer, Texas A&M University
(Optional) E.4
Simulation data mining for functional TPG Charles Wen and
Li-C. Wang, UC-Santa Barbara |
3pm-4:15pm |
Special session F: IJTAG Organizer:Al
Crouch, Inovys
Speaker: Jason
Doege, Cadence Speaker: Adam Ley and Glenn Woppmann,
Asset-InterTech Speaker: Al Crouch, Inovys |
4:30 – 5:45pm |
Special session G: Sequential EQ
G.1 Using
sequential equivalence checking in a microprocessor design
flow Brian Kahne, Magdy Abadir, Freescale Semiconductor
G.2
Sequential Equivalence Checking of RTL Models Gagan
Hasteer,
Venkat Krishnaswamy and Nikhil Sharma, Calypto Design Systems
G.3
Seq-SAT - An Efficient Sequential Circuit SAT Solver and Its
Application to Sequential Equivalence Checking Feng Lu, K.-T.
Cheng and L.C Wang, Department of ECE, University of California at
Santa
Barbara |
6pm |
Close | |