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IEEE 6th International Workshop on
Microprocessor Test & Verification (MTV 2005)
November 3- 4, 2005
Hyatt Town Lake Hotel, Austin, Texas, USA

http://mtv.ece.ucsb.edu/MTV/

CALL FOR PARTICIPATION

Overview -- Preliminary Program

Overview

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Deadlines

  • Advance Workshop Reservation: October 23, 2005, 5pm USA EST
  • Advance Hotel Registration: October 12, 2005 Rate $149

MTV'05 Workshop Registration and Hotel Reservations are available at:

http://mtv.ece.ucsb.edu/MTV/

Hyatt Town Lake Hotel, 208 Barton Springs Road, Austin, Texas 78704
Reservation Number: 1 (800) 233-1234 or (512) 477-1234

Preliminary Program

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Wednesday, November 2, 2005
7-9pm Reception & On-Site Registration at Hyatt
Thursday, November 3, 2005
7:30-8:30am Continental Breakfast
8:30-9:30am Keynote Address
9:30-11:50am (including a 10-15 minutes coffee break) Session A: Architectural/Functional Verification
Organizer: Eli Almog, IBM

A.1 A Study of Architecture Description Languages from a Model-based Perspective
Prof. Wei Qin (Boston University)

A.2 An Introduction to the Plasma Language
Brian Kahne, Pete Wilson, and Aseem Gupta (Freescale)

A.3 Embedded Processor Design and SW Tool Generation Using LISA
Andreas Hoffmann (CoWare)

A.4 Verifying Configurable ISAs Described in Tensilica's Instruction Extension (TIE) Language
Dhanendra Jani (Tensilica)

A.5 Processor Architecture Description Language for Test Generation
Eli Almog (IBM)

11:50am-1pm Lunch Break
1pm – 2:40pm Session B: Debug and Diagnosis

B.1 Diagnosing faulty functional units in processors by using automatically generated test sets
P. Bernardi, E. Sanchez, M. Schillaci, G. Squillero, M. Sonza Reorda
Dipartimento di Automatica e Informatica, Politecnico di Torino, Italy

B.2 Post-Verification Debugging of Hierarchical Designs
Moayad Fahim Ali, University of Toronto
Sean Safarpour, University of Toronto
Andreas Veneris, University of Toronto
Magdy S. Abadir, Freescale Semiconductor
Rolf Drechsler, University of Bremen, Germany

B.3 An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects
Jennifer Lynn Dworak,
Brown University

B.4 Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
P. Bernardi, M. Grosso, M. Rebaudengo, M. Sonza Reorda
Politecnico di Torino, Dipartimento di Automatica e Informatica, Torino, Italy

Coffee Break
3:50 pm – 4:30pm Session C: SAT applications

C.1 Language-driven Validation of Pipelined Processors using Satisfiability Solvers
Prabhat Mishra Heon-Mo Koo Zhuo Huang
University of Florida, Gainesville, FL

C.2 Bounded Invariant Checking of Partial Implementations using a Structural SAT-Solver
Marc Herbstritt and Bernd Becker
Albert-Ludwigs-University Freiburg, Germany

C.3 PaMira – a Parallel SAT Solver with Knowledge Sharing
Tobias Schubert Matthew Lewis Bernd Becker
Institute for Computer Science, Albert-Ludwigs-University of Freiburg, Freiburg, Germany

4:30 – 5:45pm Session D: Microprocessor test, circuit marginality and speed binning

D.1 Is IDDQ Test of Microprocessors Feasible?
Bin Xue and D. M. H. Walker, Texas A&M University

D.2 Improved methods for Circuit Marginality, Speed Path & Manufacturing Defect Detection
Greg Czajkowski, Dave LaFollette, Paul R. Zehr
Intel Corporation

D.3 A study on speed binning with structural tests
Benjamin Lee, Jing Zeng, Li-C. Wang, Magdy S. Abadir
UC-Santa barbara and Freescale

6-10pm Dinner and Social Event
November 4, Friday
7:30 – 8:30am Continental Breakfast
8:30 – 9:45am Session E: Validation

E.1 Automated Extraction of Structural Information from SystemCbased IP for Validation
David Berner, Institut de Recherche en Informatique et Systèmes Aléatoires, France
Hiren D. Patel, Virginia Polytechnic and State University
Deepak A. Mathaikutty, Virginia Polytechnic and State University
Sandeep K. Shukla, Virginia Polytechnic and State University

E.2 Pre-Silicon Validation of IPF Memory Ordering for Multi-Core Processors
Paul R Zehr and Soohong Kim, Intel Corporation

E.3 Automatic Generation of High Performance Embedded Memory Models for PowerPC Microprocessors
Jayanta Bhadra, Freescale Semiconductor
Magdy S. Abadir, Freescale Semiconductor
David Burgess, Freescale Semiconductor
and Ekaterina Trofimova, Freescale Semiconductor

9:45am – 10am Coffee Break
10am – 11:40am Session F: High-level ATPG and Verification

F.1 On PSL Properties Re-use in SoC Design Flow Based on Transaction Level Modeling
Nicola Bombieri, STMicroelectronics
Andrea Fedeli, STMicroelectronics
Franco Fummi, University of Verona

F.2 A Pseudo-Deterministic Functional ATPG based on EFSM Traversing
G. Di Guglielmo F. Fummi C. Marconcini G. Pravadelli
Dipartimento di Informatica - Università di Verona, Italy

F.3 SEARCH-SPACE OPTIMIZATIONS FOR HIGH-LEVEL ATPG
Jorge Campos and Hussain Al-Asaad
University of California—Davis

F.4 HW/SW Co-Verification of a RISC CPU using Bounded Model Checking
Daniel Grosse, Ulrich Kuehne, Rolf Drechsler, University of Bremen

11:40 – 12:40pm Lunch Break
12:55 – 3pm Session E: Invited Presentations

E.1 3D Packaging – Its impact and implications
T. M. Mak, Intel Corporation

E.2 Equivalence Checking -- An Industry Perspective
Kei-Yong Khoo, Cadence Design Systems, Inc. (Verplex group)

E.3 A TDM Test Scheduling Method for Network-on-Chip Systems
Mark Nolen, Rabi Mahapatra and Ray Mercer, Texas A&M University

(Optional) E.4 Simulation data mining for functional TPG
Charles Wen and Li-C. Wang, UC-Santa Barbara

3pm-4:15pm Special session F: IJTAG
Organizer:Al Crouch, Inovys

Speaker: Jason Doege, Cadence
Speaker: Adam Ley and Glenn Woppmann, Asset-InterTech
Speaker: Al Crouch, Inovys

4:30 – 5:45pm Special session G: Sequential EQ

G.1 Using sequential equivalence checking in a microprocessor design flow
Brian Kahne, Magdy Abadir, Freescale Semiconductor

G.2 Sequential Equivalence Checking of RTL Models
Gagan Hasteer, Venkat Krishnaswamy and Nikhil Sharma, Calypto Design Systems

G.3 Seq-SAT - An Efficient Sequential Circuit SAT Solver and Its Application to Sequential Equivalence Checking
Feng Lu, K.-T. Cheng and L.C Wang, Department of ECE, University of California at Santa Barbara

6pm Close
For more information, visit us on the web at: http://mtv.ece.ucsb.edu/MTV/

The IEEE 6th International Workshop on Microprocessor Test & Verification (MTV 2005) is organized by the University of Southampton and sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society– Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia– Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com


TTTC 2ND VICE CHAIR
Michel RENOVELL
LIRMM– France
Tel. +33 467 418 523
E-mail renovell@lirmm.fr

FINANCE CHAIR
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

IEEE DESIGN & TEST EIC
Rajesh K. GUPTA
University of California, Irvine– USA
Tel. +1-949-824-8052
E-mail gupta@uci.edu

TECHNICAL MEETINGS
Cheng-Wen WU

National Tsing Hua Univ.– Taiwan
Tel. +886-3-573-1154
E-mail cww@computer.org

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica– Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Inst. of Science and Technology– Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal Univ. of Rio Grande do Sul (UFRGS)– Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic, Inc.– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino– Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University– USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM– France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

ITC GENERAL CHAIR
Rob AITKEN
Artisan Components– USA
Tel. +1-408-548-3297
E-mail aitken@artisan.com

TEST WEEK COORDINATOR
Yervant ZORIAN
Virage Logic, Inc.– USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

Univ. of Piraeus– Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys– USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Joan FIGUERAS
Univ. Politècnica de Catalunya– Spain
Tel. +55-51-228-1633, Ext. 4830
E-mail figueras@eel.upc.es

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut– Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
iRoC Technologies– Greece
Tel. +33-4-381-20763
E-mail michael.nicolaidis@iroctech.com

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino– Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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